Manufacturing Test Optimization for VXI-Based Scanning Analog-to-Digital Converters
The high density of the hardware for the HP E1413 scanning analog-to-digital converter, the low cost per channel, and the wide variety of optional signal conditioning plug-ons require a production test strategy that is fast, flexible, and efficient.
by Bertram S. Kolts and Rodney K. Village
Article 6 - oct94a6.pdf
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