Tad Hogg and Greg Snider
Abstract
Crossbar architectures are one approach to molecular electronic
circuits for memory and logic applications. However, currently
feasible manufacturing technologies introduce numerous defects so
insisting on defect-free crossbars would give unacceptably low
yields. Instead, increasing the area of the crossbar provides
enough redundancy to implement circuits in spite of the defects.
We identify reliability thresholds in the ability of defective
crossbars to implement boolean logic. These thresholds vary among
different implementations of the same logical formula, allowing
molecular circuit designers to trade-off reliability, circuit area
and the computational complexity of locating functional
components. We illustrate these choices for an AND gate and, of
more practical interest, binary adders.
preprint (pdf)
published in IEEE Trans. on Nanotechnology, 5(2) 97-100 (2006)
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