HP Labs Technical Reports
Simultaneous Thickness and Group Index Measurement Using Optical Low-Coherence Reflectometry
Sorin, Wayne V.; Gray, D. F.
Abstract: Using high resolution optical reflectometry, group index and physical thickness can both be determined by precisely measuring optical time delays through a sample. Optical low-coherence reflectometry offers both the high spatial resolution and large dynamic range required to perform accurate measurements using this technique.
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