HP Labs Technical Reports
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High-Frequency Photodiode Characterization using a Filtered Intensity Noise Technique
Baney, Doug M.; Sorin, Wayne V.; Newton, Steve A.
Abstract: Optical filtering of amplified spontaneous emission improves measurement dynamic range for frequency response measurements of optoelectronic receivers. For high bandwidth receivers, a novel etalon filtered intensity noise technique is proposed. Response measurements using these techniques on a 3 GHz and 30 GHz receiver are demonstrated.
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