On-Chip Cross Talk Noise Model for Deep-Submicrometer ULSI Interconnect
A simple closed-form model for calculating cross talk noise on signal lines in deep-submicrometer interconnect systems has accuracy comparable to SPICE for an arbitrary ramp input rate. Interconnect resistance, interconnect capacitance, and driver resistance are all taken into account. The model is suitable for rapid cross talk estimation and signal integrity verification.
by Samuel O. Nakagawa, Dennis M. Sylvester, John G. McBride, and Soo-Young Oh
Article 4 - aug98a4.pdf
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