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High Power Semiconductor Edge-Emitting Light Emitting Diodes for Optical Low Coherence Reflectometry

Fouquet, Julie E.; Trott, Gary; Sorin, Wayne V.; Ludowise, Michael J.; Braun, David

HPL-94-54

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Abstract: A new semiconductor source was designed for optical low coherence reflectometry, increasing the sidelobe-free dynamic range by three to five orders of magnitude compared to conventional EELEDs. Reflectivities internal to an optical fiber circuit separated by as much as eight orders of magnitude can now be detected at wavelengths of 1.3 and 1.55 mu m using compact semiconductor sources. In addition, nearly 1 mW of optical power with a smooth spectrum at a wavelength of 1.5 mu m was coupled into single mode fiber at a 200 mA drive current near 0 degrees C.

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